University of Manchester

Nikon XTH 225

Figure 1

Figure 1: Nikon XTEK XTH 225kV cabinet system.

Figure 3

Figure 2: 225kV multi metal anode Nikon X-ray source shown within the XTH 225kV cabinet.

Instrument Overview

The Nikon XTEK XTH 225kV cabinet system is a standard X-ray Computed Tomography (XCT) system produced by Nikon XTEK (Figure 1). The Nikon XTH 225kV cabinet system is ideal for small specimens of less than 300mm in height due to the smaller enclosure (Figure 2).

Key features:

  • Typical scan times using the Nikon Metrology 225/320 kV Custom bay vary from 10 to 120 minutes.
  • The resolution will vary from 3 to 104 microns for specimen areas¬†with a diameter of < 10 mm and up to 300 mm diameters respectively.¬†
  • Specimens larger than 300 mm can be analysed by taking linked scans that can then be pieced back together during the reconstruction stage, however this capability is limited by the cabinet size.
  • MXIF welcomes collaborations on research projects with other institutions.  If you would like to discuss using MXIF equipment for your research please contact Dr Tristan Lowe. 

    For industrial collaborations please contact Dr James Carr 

    Imaging Systems

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