Zeiss Xradia 520 Versa with DCT

Versa 520

Figure 1: Zeiss Xradia Versa 520 XCT system viewed from outside.

Versa 520 with DCT

Figure 2: Zeiss Xradia Versa 520 XCT system viewed within the cabinet.

The Zeiss Xradia Versa 520 XCT system is a sub-micro resolution instrument with extensive imaging capabilities (Figure 1). The system bridges the gap in resolution between the traditional lower resolution (~100 to 5 μm) geometric magnification systems and the high resolution (~20 nm to 200 nm) X-ray optical systems. The system is fitted with X0.5, X4, X10, and X20 magnification lens mounted on a barrel mount for rapid change over. This lens configuration provides the capability of achieving resolutions down to 70 nm pixel size or spatial resolution or 0.7 µm. The system can also be used for in-line phase contrast to increase contrast while imaging low absorbing specimens, a technique is particularly useful for imaging biological specimens, tissue engineering and polymer materials.

Key features:

  • General capabilities as for the ZEISS Xradia 520 system
  • Utilisation of Diffraction Computed Tomography (DCT)
  • Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
  • Dedicated cable encapsulation of in-situ rig control
  • MXIF welcomes collaborations on research projects with other institutions.  If you would like to discuss using MXIF equipment for your research please contact Dr Sam McDonald.  

    For industrial collaborations please contact Dr James Carr. 

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